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Issued patent

Macroflash (Cup Cryostat)

An issued NASA patent from the Technology Transfer catalog.

Media from NASA Technology Transfer

About this technology

Overview

NASA Kennedy Space Center seeks partners interested in a practical method for measuring thermal performance of materials at below-ambient temperatures or subjected to a large temperature difference. The technology uses liquid nitrogen as a direct heat energy meter and is applicable to testing at a wide range of temperatures from 373 K down to 77 K and under an ambient pressure environment. The Macroflash follows the guidelines of the newly established technical standard ASTM C1774 (Annex A4) and provides a cost-effective, field-representative methodology to test any material for below-ambient temperature applications. From engineered systems to research testing to quality control in manufacturing, the technology provides utility for the fields of energy, transportation, construction, and environment.