Issued patent
Digital Projection Focusing Schlieren System
An issued NASA patent from the Technology Transfer catalog.
About this technology
Overview
Typically, multiple imaging systems are required to collect focusing schlieren and other image-based measurement data. Additionally, conventional focusing schlieren imaging systems are only sensitive to a single density gradient. Researchers at NASA's Langley Research Center have developed a compact LCD-integrated optical assembly that enables a research camera to simultaneously collect focusing schlieren and other image-based measurement data (e.g., particle tracking velocimetry (PTV), particle imaging velocimetry (PIV), temperature or pressure sensitive paint measurements (TSP, PSP), or photogrammetry). The assembly was designed to enhance the capabilities of NASA Langley's patented self-aligned, single-grid projection focusing schlieren imaging system described in LAR-TOPS-348, and reduce the complexity and time required to perform multiple image-based measurement experiments. NASA's digital single-grid system leverages a programmable LCD as the grid, enabling on-the-fly grid adjustments (or grid deactivation) to enable a substantial amount of experimental flexibility for image-based measurements.