Patent — available for licensing
Optimization of X-Ray CT Measurement Accuracy for Metal AM Components
A NASA invention available to explore as a licensing opportunity.
About this technology
Overview
In aerospace and other industries, metal additive manufacturing (AM) technologies are poised to enable the rapid production of complex, custom components that provides a host of advantages. However, metal AM exhibits high complexity compared to conventionally manufactured parts (e.g., point-by-point deviations in grain structure, material properties, and defect conditions). These complexities make it difficult to ensure accuracy and detectability of critical defects via nondestructive evaluation (NDE). As a result, despite their promise, few metal AM parts have made their way into commercial use for safety-critical applications (aerospace, medical, etc.). X-Ray Computed Tomography (X-Ray CT) has become the gold standard for volumetric characterization of metal AM components. However, X-Ray CT can have defect detection measurement uncertainty, particularly for porosity (the most prominent safety-critical defect in metal AM). A recent study of different labs performing X-Ray CT-based inspection of metal AM parts found that, across 10 different facilities, maximum pore size measured varied by a factor of 4.5 and bulk porosity estimated varied by over a factor of 7! Clearly, a new highly accurate and reliable technique is required that can help develop and can improve the accuracy and reliability of part-specific X-ray CT NDE to speed up certification, enabling industry to realize the advantages of metal AM components for safety-critical applications.