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Patent — available for licensing

Optimization of X-Ray CT Measurement Accuracy for Metal AM Components

A NASA invention available to explore as a licensing opportunity.

Media from NASA Technology Transfer

About this technology

Overview

In aerospace and other industries, metal additive manufacturing (AM) technologies are poised to enable the rapid production of complex, custom components that provides a host of advantages. However, metal AM exhibits high complexity compared to conventionally manufactured parts (e.g., point-by-point deviations in grain structure, material properties, and defect conditions). These complexities make it difficult to ensure accuracy and detectability of critical defects via nondestructive evaluation (NDE). As a result, despite their promise, few metal AM parts have made their way into commercial use for safety-critical applications (aerospace, medical, etc.). X-Ray Computed Tomography (X-Ray CT) has become the gold standard for volumetric characterization of metal AM components. However, X-Ray CT can have defect detection measurement uncertainty, particularly for porosity (the most prominent safety-critical defect in metal AM). A recent study of different labs performing X-Ray CT-based inspection of metal AM parts found that, across 10 different facilities, maximum pore size measured varied by a factor of 4.5 and bulk porosity estimated varied by over a factor of 7! Clearly, a new highly accurate and reliable technique is required that can help develop and can improve the accuracy and reliability of part-specific X-ray CT NDE to speed up certification, enabling industry to realize the advantages of metal AM components for safety-critical applications.