Patent — available for licensing
X-Ray Crack Detectability
A NASA invention available to explore as a licensing opportunity.
About this technology
Overview
Innovators at NASA Johnson Space Center have developed flaw size parameter modeling to determine if a specific X-ray setup can detect cracks of various sizes within materials. These models allow users to optimize X-ray radiography setups, for the detection of crack and crack-like flaws, to penetrate various materials to show internal structures such as the threaded pipe shown above. The ability to quantify crack detection sensitivity paves the way for crack detection requirements to be defined for X-ray radiography nondestructive evaluation (NDE) of manufactured parts. Improved industry requirements for reliable crack detection using x-ray radiography and improved X-ray setup optimization tools that are based on software modeling, such as this technology, may be desired by industry. The Model-Based X-Ray Crack Detection Requirements is a technology readiness level (TRL) 6 (system/sub-system model or prototype demonstrated in an operational environment). The innovation is now available for your company to license. Please note that NASA does not manufacture products itself for commercial sale.