Patent — available for licensing
Enhanced Software Suite Maximizes Non-Destructive Evaluation (NDE) Methods
A NASA invention available to explore as a licensing opportunity.
About this technology
Overview
Researchers at NASA Johnson Space Center have developed novel techniques for post-processing of flash infrared (IR) thermography data, providing efficient and cost-effective enhancements to Non-Destructive Evaluation (NDE) of structures for numerous applications. Compatible with commercial IR thermography products, this suite of tools provides both quantitative and qualitative data analysis capabilities and reliable detection and characterization of anomalies in composite and some metallic hardware. By adding the Transient Thermography method, which is able to detect flaws on thicker parts faster than other methods, and the Lock-in Thermography method, which uses a sinusoidal power cycle to provide better flaw resolution, the Flash Thermography NDE Technology Suite has expanded its applicability to other commonly used infrared thermography techniques, enhancing operator accuracy and efficiency.